Application of Polarization Modulation Spectroscopy to the Study of Magnetic Materials

Over the last decade, X-ray Magnetic Circular Dichroism (XMCD) and X-ray Resonant Magnetic Scattering (XRMS) have become important experimental techniques in the study of magnetic materials. In order to reduce systematic errors in these measurements, typical XMCD and XRMS experiments are carried out using magnetization switching, although there are many situations where polarization switching is clearly desirable. Recently, fast polarization modulation techniques have been developed using either polarization conversion optical elements, such as phase plate, or special insertion devices. At NSLS, an Elliptically Polarized Wiggler (EPW), jointly developed by NSLS, APS, and BINP of Novosibirsk, for this purpose. The EPW consists of a permanent magnet vertical wiggler and an electromagnet horizontal wiggler. The polarization of the device can be switched up to 100 Hz by switching the electromagnet. To take advantage of the fast switching capability, a phase sensitive detection system was also implemented. The sensitivity of using fast polarization modulation is demonstrated by measuring the element specific hysteresis loop and MCD spectrum of Cu induced moment at the interface of a Co/Cu multilayer. By comparing with results obtained using conventional measurements from similar samples, it clearly shows the advantages of using polarization modulation for small MCD effects.